MEASURING METHOD FOR ACTIVE MATRIX TFT ARRAY

摘要

PROBLEM TO BE SOLVED: To provide a measuring method with high accuracy in a storage characteristics test of a storage capacitor of a TFT array.

SOLUTION: The measuring method of storage characteristics for the active matrix TFT array including a plurality of pixel circuits equipped with the storage capacitors wherein the plurality of pixel circuits are equipped with at least the first and the second pixel circuits, is characterized by including steps: to charge the storage capacitor of the first pixel circuit; next to charge the storage capacitor of the second pixel circuit; to conduct an operation to solve an influence of the stray capacitance; and to measure charges of the storage capacitors of the first and the second pixel circuits after a prescribed storage time period has passed since charging.

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