发明名称 Correcting a mask pattern by selectively updating the positions of specific segments
摘要 Correcting a mask pattern includes accessing the mask pattern segmented into segments. An attribute value is established for each segment, where the attribute value for a segment describes an attribute of the segment. The following is repeated for one or more of the attribute values to generate a corrected mask pattern: selecting segments using one or more attribute values; calculating a current correction value for each of the selected segments with respect to previously selected segments updated according to previously calculated correction values; and updating the selected segments according to the current correction values.
申请公布号 US2006123379(A1) 申请公布日期 2006.06.08
申请号 US20040005866 申请日期 2004.12.06
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 ATON THOMAS J.
分类号 G06F17/50 主分类号 G06F17/50
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