发明名称 Metal film vapor phase deposition method and vapor phase deposition apparatus
摘要 A copper film vapor phase deposition method includes the steps of exposing high-purity copper to a plasma of a gas containing chlorine gas to etch the high-purity copper, thereby generating active Cu<SUB>x</SUB>Cl<SUB>y</SUB>, wherein x is 1 to 3, y is 1 to 3, gas, and forming a copper film by transporting the Cu<SUB>x</SUB>Cl<SUB>y </SUB>gas onto the surface of a substrate to be processed. By using inexpensive high-purity copper and inexpensive chlorine, hydrogen chloride, or chlorine and hydrogen as source gases, a copper film containing no residual impurity such as carbon and having high film quality can be formed with high reproducibility.
申请公布号 US2006118046(A1) 申请公布日期 2006.06.08
申请号 US20060336898 申请日期 2006.01.23
申请人 SAKAMOTO HITOSHI;YAHATA NAOKI 发明人 SAKAMOTO HITOSHI;YAHATA NAOKI
分类号 C23C14/04;C23C16/08;C23C14/22;C23C16/00;C23C16/14;C23C16/448;H01L21/285 主分类号 C23C14/04
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