发明名称 Method of manufacturing single crystal Si film
摘要 Provided is a method of manufacturing a single crystal Si film. The method includes: preparing a Si substrate on which a first oxide layer is formed and an insulating substrate on which a second oxide layer is formed; forming a dividing layer at a predetermined depth from a surface of the Si substrate by implanting hydrogen ions from above the first oxide layer; bonding the insulating substrate to the Si substrate so that the first oxide layer contacts the second oxide layer; and forming a single crystal Si film having a predetermined thickness on the insulating substrate by cutting the dividing layer by irradiating a laser beam from above the insulating substrate. Therefore, a single crystal Si film having a predetermined thickness can be formed on an insulating substrate.
申请公布号 US2006121691(A1) 申请公布日期 2006.06.08
申请号 US20050071175 申请日期 2005.03.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 NOGUCHI TAKASHI;XIANYU WENXU;YIN HUAXIANG
分类号 H01L21/30 主分类号 H01L21/30
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