| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for inspecting a component having a surface profile that includes a local minima and a local maxima. SOLUTION: The method (200) includes steps of positioning an eddy current probe proximate to a surface of the component to generate a first position indication (202); positioning the eddy current probe proximate to the surface of the component to generate a second position indication that is different than the first position indication(204); and interpolating between the first and second position indications to determine a profile of a portion of the surface of the component (206). COPYRIGHT: (C)2006,JPO&NCIPI |
