发明名称 Method for detecting lateral surface charge migration through double exposure averaging
摘要 The amount of lateral charge migration (LCM) on a photoreceptor is quantified by measuring the average potential of a latent image formed on the photoreceptor surface. The surface is first uniformly charged, then exposed a first time to an image. After a waiting period during which LCM may occur, the surface is exposed a second time to the image. After another waiting period, the average potential is measured. The amount of LCM may be quantified by varying the waiting periods.
申请公布号 US2006120556(A1) 申请公布日期 2006.06.08
申请号 US20040005980 申请日期 2004.12.07
申请人 XEROX CORPORATION 发明人 SILVESTRI MARKUS R.;JEYADEV SURENDAR;MISHRA SATCHIDANAND;HINCKEL M. J.;DOMM EDWARD;MARKOVICS JAMES M.
分类号 G06K9/00 主分类号 G06K9/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利