发明名称 PROBE DEVICE AND SAMPLE INSPECTION DEVICE EQUIPPED WITH IT
摘要 PROBLEM TO BE SOLVED: To provide a probe device free from damaging a sample in changing of a probe. SOLUTION: Of the probe device provided with a probe 1 for detecting sample information, a probe retaining member 2 for retaining the probe 1 at a tip part 2b, and a support member 3 for supporting a base end part 2a of the probe retaining member 2, the probe retaining member 2 is made free to move between a detecting position of the sample information and a shelter position from the sample 10 with its base end part 2a as a fulcrum. With this, exchanging of the probe 1 can be made with the probe retaining member 2 at the shelter position, so that the sample 10 will never be damaged. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006147245(A) 申请公布日期 2006.06.08
申请号 JP20040333369 申请日期 2004.11.17
申请人 JEOL LTD 发明人 SEKINE MASARU
分类号 H01J37/20;G01Q10/00;G01Q30/02;G01Q70/00;G01Q70/02;G01Q90/00;H01J37/28;H01J37/30 主分类号 H01J37/20
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