发明名称 System und Verfahren zum Vorraussagen des Fehlerquotients von einem Produkt
摘要 <p>A defective ratio evaluation method includes a step (100) of classifying defective information describing product structure and manufacturing features which become product defective occurrence factors and making the defective information accessible, a step (110, 120, 130) of comparing design information of a product to be evaluated with the detective information, computing types of defective information and a number of defective information items included in the design information, and computing, using the types of defective information and the number of defective information items thus computed, a degree of occurrence of an event in which the evaluation objective product becomes defective; and a step (140) of displaying the degree of defective occurrence thus computed. <IMAGE></p>
申请公布号 DE69931118(D1) 申请公布日期 2006.06.08
申请号 DE1999631118 申请日期 1999.09.28
申请人 HITACHI, LTD. 发明人 SUZUKI, TATSUYA
分类号 G06F17/50;G05B19/418;G06F19/00;G06Q50/00;G06Q50/04;H05K13/04 主分类号 G06F17/50
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