| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a memory device capable of setting an 8-bit or 16-bit output mode, and executing testing in any one of the modes. <P>SOLUTION: In the memory device capable of setting an 8-bit or 16-bit output mode, in the 8-bit output mode, 8 bit lines are selected as data output lines among 8 data output lines according to the most significant bit value of address bits, a memory address having a defective cell to be replaced by a repair cell when the defective cell is present is stored including the most significant bit in a comparison part, and a replacing operation is carried out. In the 16-bit output mode, all 16 bit lines are used as data output lines, and a replacing operation is carried out via the comparison part irrespective of the most significant bit value. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p> |
