发明名称 SOLID-STATE IMAGING APPARATUS AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a solid-state imaging apparatus having a high sensitivity and little after-image, and to provide its manufacturing method. SOLUTION: When light is incident into a photoelectric conversion film 21, paired electron-holes are created and the holes move to the side of a transparent electrode 22 while the electrons are accumulated in an accumulation diode 13 via a pixel electrode 20. At this point, since there is no recombination center nor a trap level inside the crystalline photoelectric conversion film 21, the reduction in photoelectric current due to the absorption of the electrons created by photoelectric conversion by a recombination center or a trap level and the occurrence of after-image due to the emission of the carrier from the trap level can be suppressed. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006147657(A) 申请公布日期 2006.06.08
申请号 JP20040332186 申请日期 2004.11.16
申请人 SHARP CORP 发明人 MATSUO NAOHIRO;YOSHIDA SHINYA;YOKOZAWA YUJI;IWAI YOSHIFUMI
分类号 H01L27/146;H04N5/335;H04N5/359;H04N5/369;H04N5/372 主分类号 H01L27/146
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