ELECTRONIC SPECTRUM MEASURING METHOD AND APPARATUS

摘要

PROBLEM TO BE SOLVED: To precisely evaluate an electronic spectrum at an interface and to enhance the throughput in a detection work. SOLUTION: This electronic spectrum measuring apparatus is constituted so that narrow-band femtosecond visible/inner infrared rays with a frequencyω1 are emitted and a wide-band visible/near infrared pulse light L2 with a frequencyω2 is obtained by a filter for cutting white light on a short wavelength side of 540 nm or below. Narrow-band pulse light L1 with the frequencyω1 and a wide-band visible/near infrared pulse light L2 with the frequencyω2 extending over a range from 540 nm to 1.1μm are non-coaxially condensed to the same point of the gas/liquid interface 1a of a sample 1. When both lights L1 and L2 coincide with each other at the interface 1a temporally and spatially, signal light L4 with a sum frequencyω1+ω2 is emitted. The signal light L4 is guided to a polychromator 5. The polychromator 5 is guided to the braze with the focal distance of 300 mm of the concave mirror and the ruling number of 300/mm of diffraction lattice in a spectroscope having one diffraction lattice to be subjected to wavelength dispersion and detected by a CCD 7. COPYRIGHT: (C)2006,JPO&NCIPI