摘要 |
PROBLEM TO BE SOLVED: To provide a burn-in device capable of making testing conditions even, by restraining dispersion of temperatures in a plurality of tested objects generating heat by an operation, and capable of enhancing thereby reliability for a burn-in test and an aging test. SOLUTION: The heat generated by the operation of each semiconductor laser element 2 is transmitted to a heat sink 5, because a heat radiation part 58 of the each semiconductor laser element 2 held by a holding means 4 contacts with the heat sink 5. A heat pipe 6 is provided in the heat sink 5 along an arrayed direction of the respective semiconductor laser elements 2 held by the holding means 4 and transfers the heat to the heat sink 5, the dispersion of temperatures in the heat sink 5 is restrained along the arrayed direction of the respective semiconductor laser elements 2, because the heat is transferred from the the heat sink 5, and the dispersion of the temperatures in the respective semiconductor laser elements 2 is restrained by this manner. COPYRIGHT: (C)2006,JPO&NCIPI
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