发明名称 TESTING DEVICE, AND CONTROL METHOD THEREFOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a technique for conducting an individual function test corresponding to forced finish, and an efficient logic circuit verification technique of high quality capable of preparing intentionally even a test pattern paid with attention to constitution of a verification objective logic circuit, while automating logical verification for an LSI or a system including it. <P>SOLUTION: Information concerned in a hardware resource used in a function block is registered in a pre-stage for conducting the function test, and the registered information is released to finish execution of the function test forcibly, when a forced finish instruction is detected during the execution of the function test. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006145353(A) 申请公布日期 2006.06.08
申请号 JP20040335006 申请日期 2004.11.18
申请人 CANON INC 发明人 HAGIWARA TADAOKI
分类号 G01R31/28;G06F11/22 主分类号 G01R31/28
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