发明名称 METHOD OF FORMING A POLYSILICON RESISTOR
摘要 A method of forming a polysilicon resistor includes: providing a substrate, the substrate comprising a dielectric layer; forming a polysilicon layer on the dielectric layer; doping the entire polysilicon layer evenly with first type dopants; doping said polysilicon layer containing the first type dopants with second type dopants; defining a polysilicon resistor pattern on the polysilicon layer and removing the polysilicon layer and the dielectric layer outside the polysilicon resistor pattern down to the surface of the substrate, the remainder of the polysilicon layer comprising at least a high resistance region and a low resistance region; and forming a salicide layer on the remainder of the polysilicon layer within the low resistance region.
申请公布号 US2006121684(A1) 申请公布日期 2006.06.08
申请号 US20060307503 申请日期 2006.02.10
申请人 CHEN CHENG-HSIUNG 发明人 CHEN CHENG-HSIUNG
分类号 H01L21/20 主分类号 H01L21/20
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