发明名称 |
DEVICE AND METHOD FOR MEASURING THE SURFACE TOMOGRAPHY AND WAVE ABERRATION OF A LENS SYSTEM, PARTICULARLY AN EYE |
摘要 |
A device and a method are used for measuring the surface topography and a wave aberration of a lens system. The device is fitted with a first measuring system containing a light source radiating a first light beam of a first wavelength, and a detector which captures the first light beam which is reflected on the lens system. In addition the device has a second measuring system containing a light source for radiating a second light beam of a second wavelength and a detector for capturing the second light beam transmitted by the lens system. A diffractive optical element is disposed in a common beam path of the first measuring system and second measuring system. The optical element adapts the respective wave-front course of the first light beam and the second light beam in a wavelength-selective manner. |
申请公布号 |
EP1662981(A1) |
申请公布日期 |
2006.06.07 |
申请号 |
EP20040764869 |
申请日期 |
2004.09.06 |
申请人 |
OPTOCRAFT GMBH |
发明人 |
BEYERLEIN, MATHIAS;PFUND, JOHANNES |
分类号 |
A61B3/103;A61B3/107;(IPC1-7):A61B3/107 |
主分类号 |
A61B3/103 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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