发明名称 |
Measuring method and apparatus using attenuated total reflection |
摘要 |
A small-sized measuring apparatus having a stray light suppressing capability for detecting the distribution of optical intensities on the cross section of a light beam having a predetermined wavelength contained in a light beam reflected from a measuring surface by entering a collimated light beam having a large cross sectional area into the measuring surface. A collimated light beam having a sufficient cross sectional area is entered into the interface between a dielectric block and a thin metal film formed on the dielectric block at an angle that satisfies the conditions of total reflection. A light beam having a predetermined wavelength is selected from the light beam totally reflected at the interface to detect the distribution of optical intensities for the selected light beam by the wavelength selecting section capable of eliminating stray light.
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申请公布号 |
US7057731(B2) |
申请公布日期 |
2006.06.06 |
申请号 |
US20030669651 |
申请日期 |
2003.09.25 |
申请人 |
FUJI PHOTO FILM CO., LTD. |
发明人 |
NAYA MASAYUKI |
分类号 |
G01N21/03;G01N21/55;G01N21/05;G01N21/27 |
主分类号 |
G01N21/03 |
代理机构 |
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代理人 |
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主权项 |
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