| 摘要 |
A method of calibrating an analogue probe ( 10 ) having a stylus ( 12 ) with a workpiece-contacting tip ( 14 ) or a non-contact probe ( 26 ). A calibration artefact such as a calibration sphere ( 16 ) is mounted on a coordinate measuring machine (CMM) ( 18 ). The probe ( 10,26 ) is mounted on an arm ( 8 ) of the CMM and the probe is moved along a path whilst continually scanning the surface of the calibration artefact such that the probe is exercised throughout its working range. For an analogue probe ( 10 ) having a workpiece-contacting stylus ( 12 ), the path is such that the deflection of the stylus varies along the path. For a non-contact probe ( 26 ) the path is such that there is variation of the radial distance between the path and the calibration artefact. The probe path may comprise a path parallel to a chord of the calibration sphere or a curved, e.g. a sinusoidal, path.
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