发明名称 |
System for and method of investigating the exact same point on a sample substrate with at least two wavelengths |
摘要 |
Disclosed are system for and method of analyzing the substantially the exact same point on a sample system with at least two wavelengths, or at least two ranges of wavelengths for which the focal lengths do not vary more than within an acceptable amount.
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申请公布号 |
US7057717(B1) |
申请公布日期 |
2006.06.06 |
申请号 |
US20030426590 |
申请日期 |
2003.04.30 |
申请人 |
J.A. WOOLLAM CO., INC |
发明人 |
LIPHARDT MARTIN M.;JOHS BLAINE D.;HERZINGER CRAIG M.;HE PING;GOEDEN CHRISTOPHER A.;WOOLLAM JOHN A.;WELCH JAMES D. |
分类号 |
G01N21/00 |
主分类号 |
G01N21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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