发明名称 |
METHOD OF MANUFACTURING SILICON THIN FILM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a silicon thin film capable of suppressing concentration of impurity low, while forming a silicon thin film at a low temperature. <P>SOLUTION: A method of manufacturing a silicon thin film comprises the steps of arranging a substrate 1 in a chamber 10, and forming a silicon thin film on the substrate 1 by performing ion beam deposition under a condition of 250°C or less temperature. Preferably, a basic atmospheric pressure in the chamber 10 in which the ion beam deposition is performed is adjusted to 10<SP>-12</SP>Torr or more and 10<SP>-7</SP>Torr or less. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006140477(A) |
申请公布日期 |
2006.06.01 |
申请号 |
JP20050323464 |
申请日期 |
2005.11.08 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
KWON JANG-YEON;LIM HYUK;NOGUCHI TAKASHI;PARK YOUNG-SOO;KIM SUK-PIL;CHO SE-YOUNG;TEI CHISHIN;PARK KYUNG-BAE;KIM DO-YOUNG |
分类号 |
H01L21/203;C23C14/14;C23C14/48 |
主分类号 |
H01L21/203 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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