METHOD AND MACHINE FOR REPETITIVE TESTING OF AN ELECTRICAL COMPONENT

摘要

A method (1000,1100,1200,1300,1400) automatically tests a parameter of an electronic component (12,120) to determine whether the component (12,120) has an acceptable value. The method (1000,1100,1200,1300,1400) employs an automatic electronic component testing machine (2) having at least first and second measurement positions where the parameter can be measured. The testing process itself may falsely cause the value to appear to be unacceptable when the value is actually acceptable. The method (1000,1100,1200,1300,1400) places the component (12,120) in a first measurement position and measures the parameter in the first position, thereby generating a first measured parameter value. The method (1000,1100,1200,1300,1400) also places the component (12,120) in a second measurement position and measures the parameter in the second position, thereby generating a second measured parameter value. The method (1000,1100,1200,1300,1400) rejects the component (12,120) only if all measured values are unacceptable, whereby the probability of falsely rejecting the component (12,120) is less than if only a single measuring step were performed.