Semiconductor chip e.g. memory chip, testing method, involves providing test logic, testing chip when test mode is set, issuing test results and/or status of test mode, and selecting test result and status of mode through serial bit strands

摘要

The method involves providing test logic and testing a semiconductor chip when a test mode is set. Test results and/or status of the test mode are issued and different group of registers (RG1 - RGm) in the chip are programmed. A header for selection of group of registers is transferred and conditions of the test mode are stored. Selection of test result and/or status of the test mode is performed through a set of serial bit strands.