发明名称 Multi-step process for patterning a metal gate electrode
摘要 The present invention provides a method for patterning a metal gate electrode and a method for manufacturing an integrated circuit including the same. The method for patterning the metal gate electrode, among other steps, includes forming a metal gate electrode layer ( 220 ) over a gate dielectric layer ( 210 ) located on a substrate ( 110 ), and patterning the gate electrode layer ( 220 ) using a combination of a dry etch process ( 410 ) and a wet etch process ( 510 ).
申请公布号 US2006115972(A1) 申请公布日期 2006.06.01
申请号 US20040999271 申请日期 2004.11.29
申请人 TEXAS INSTRUMENTS, INC. 发明人 ROTONDARO ANTONIO L.;RILEY DEBORAH J.;HURD TRACE Q.
分类号 H01L21/4763;H01L21/461 主分类号 H01L21/4763
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