发明名称 High performance CMOS devices and methods for making same
摘要 An integrated circuit having high performance CMOS devices with good short channel effects may be made by forming a gate structure over a substrate; forming pocket implant regions and source/drain extensions in the substrate; forming spacers along sides of the gate structure; and thermal annealing the substrate when forming the spacers, the thermal annealing performed at an ultra-low temperature. An integrated circuit having high performance CMOS devices with low parasitic junction capacitance may be made by forming a gate structure over a substrate; forming pocket implant regions and source/drain extensions in the substrate; forming spacers along sides of the gate structure; performing a low dosage source/drain implant; and performing a high dosage source/drain implant.
申请公布号 US2006113591(A1) 申请公布日期 2006.06.01
申请号 US20040999724 申请日期 2004.11.30
申请人 WAN CHIH-HAO;WANG TA-WEI;HU CHENMING 发明人 WAN CHIH-HAO;WANG TA-WEI;HU CHENMING
分类号 H01L21/336;H01L29/94 主分类号 H01L21/336
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