发明名称 |
WIRING/ELECTRODE AND SPUTTERING TARGET |
摘要 |
<p>Wiring/electrode being low in resistivity and suitable for higher density of an electronic device, especially for making larger and finer a flat display element such as a liquid crystal display, and a sputtering target being high in discharge stability and used for the production thereof. Wiring/electrode is formed by an Al-based alloy thin film containing in Al less than 0.5 at.% in total of at least one kind of metal selected from a group III in the periodic table and containing up to 100ppm of oxygen. Accordingly, wiring/electrode is obtained which has electric resistivity as low as that of a pure Al thin film produced under the same conditions and is high in hillock resistance. Wiring/electrode further lower in resistivity and higher in hillock resistance is obtained by improving the orientation of (111) plane oriented in parallel to a substrate surface. Such wiring/electrode is obtained by forming a thin film by a sputtering method that uses a sputtering target consisting of Al-based alloy containing less than 0.5 at.% in total of at least one kind of metal selected from a group III in the periodic table and containing up to 100ppm of oxygen, and then heat-treating it at temperatures of at least 150<SUP>?</SUP>C.</p> |
申请公布号 |
WO2006057312(A1) |
申请公布日期 |
2006.06.01 |
申请号 |
WO2005JP21607 |
申请日期 |
2005.11.24 |
申请人 |
TOSOH CORPORATION;YATSUNAMI, SHUNSUKE;INASE, TOSHIO;KAWABATA, TAKAHIRO |
发明人 |
YATSUNAMI, SHUNSUKE;INASE, TOSHIO;KAWABATA, TAKAHIRO |
分类号 |
H01L21/28;C23C14/34;H01L21/285;H01L21/3205;H01L23/52 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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