GAP CHECK JIG FOR TESTER SYSTEM,申请号KR20040097945-传众专利搜索

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发明名称	GAP CHECK JIG FOR TESTER SYSTEM
摘要
申请公布号	KR20060058913(A)	申请公布日期	2006.06.01
申请号	KR20040097945	申请日期	2004.11.26
申请人	SAMSUNG ELECTRONICS CO., LTD.	发明人	RYU, YANG KYU
分类号	H01L21/68	主分类号	H01L21/68
代理机构		代理人
主权项
地址

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