发明名称 |
Test method for testing the quality of a detector module for an X-ray computer tomograph involves measurement of X-radiation with reference and test modules and then comparison and evaluation of their output signals |
摘要 |
<p>Method for testing the quality of a detector module for an X-ray computer tomograph has the following steps: provision of a measurement arrangement including X-ray source (4), reference detector module (3) and recording arrangement (1) in which the detector module to be tested is inserted; irradiation of the reference detector module and the detector (D) containing the under-test detector module and; measurement and comparison of reference and test module signals. The invention also relates to use of a X-ray computer tomograph gantry and test gantry for testing detector modules.</p> |
申请公布号 |
DE102004057741(A1) |
申请公布日期 |
2006.06.01 |
申请号 |
DE20041057741 |
申请日期 |
2004.11.30 |
申请人 |
SIEMENS AG |
发明人 |
JOERGER, CLEMENS;SPREITER, QUIRIN;HAAR, THOMAS VON DER |
分类号 |
G01T1/29;G01N23/06 |
主分类号 |
G01T1/29 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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