发明名称 Test method for testing the quality of a detector module for an X-ray computer tomograph involves measurement of X-radiation with reference and test modules and then comparison and evaluation of their output signals
摘要 <p>Method for testing the quality of a detector module for an X-ray computer tomograph has the following steps: provision of a measurement arrangement including X-ray source (4), reference detector module (3) and recording arrangement (1) in which the detector module to be tested is inserted; irradiation of the reference detector module and the detector (D) containing the under-test detector module and; measurement and comparison of reference and test module signals. The invention also relates to use of a X-ray computer tomograph gantry and test gantry for testing detector modules.</p>
申请公布号 DE102004057741(A1) 申请公布日期 2006.06.01
申请号 DE20041057741 申请日期 2004.11.30
申请人 SIEMENS AG 发明人 JOERGER, CLEMENS;SPREITER, QUIRIN;HAAR, THOMAS VON DER
分类号 G01T1/29;G01N23/06 主分类号 G01T1/29
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