发明名称 Compound semiconductor epitaxial substrate and method for manufacturing the same
摘要 In a compound semiconductor epitaxial substrate used for a strain channel high electron mobility field effect transistor which comprises an InGaAs layer as a channel layer 9 and AlGaAs layers containing n-type impurities as electron supplying layers 6 and 12 , the channel layer 9 has an electron mobility at room temperature of 8300 cm<SUP>2</SUP>/V.s or more by adjusting an In composition of the InGaAs layer composing the channel layer 9 to 0.25 or more and optimizing the In composition and the thickness of the channel layer 9 . GaAs layers 8 and 10 having a thickness of 4 nm or more each may be laminated respectively in contact with a top surface and a bottom surface of the channel layer 9.
申请公布号 US2006113563(A1) 申请公布日期 2006.06.01
申请号 US20050540513 申请日期 2005.06.23
申请人 OSADA TAKENORI;NAKANO TSUYOSHI;INOUE TAKAYUKI 发明人 OSADA TAKENORI;NAKANO TSUYOSHI;INOUE TAKAYUKI
分类号 H01L29/201;H01L31/0328;H01L21/338;H01L29/778;H01L29/812 主分类号 H01L29/201
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