VACUUM RING DESIGNS FOR ELECTRICAL CONTACTING IMPROVEMENT
摘要
<p>Recesses (72), surface contours, contact tip modifications (52), and/or other methods of ensuring pressure between a bottom surface (50) of a test plate (5) and top surfaces (52) of electrical contacts are employed to enhance cleaning of the top surfaces (52) of the electrical contacts to promote reliable measurements of DUTs.</p>
申请公布号
WO2006057783(A1)
申请公布日期
2006.06.01
申请号
WO2005US39751
申请日期
2005.11.03
申请人
ELECTRO SCIENTIFIC INDUSTRIES, INC.;GARCIA, DOUGLAS, J.;FISH, JEFFREY, L.;KIM, KYUNG YOUNG
发明人
GARCIA, DOUGLAS, J.;FISH, JEFFREY, L.;KIM, KYUNG YOUNG
