发明名称 LOCALIZED ANNEALING OF METAL-SILICON CARBIDE OHMIC CONTACTS
摘要 A contact for a semiconductor device can be formed by forming a metal on a Silicon Carbide (SiC) substrate and annealing an interface location of the metal and the SiC substrate to form a metal-SiC material thereat and avoiding annealing at a location on the SiC substrate to avoid forming the metal-SiC material thereat.
申请公布号 EP1661170(A1) 申请公布日期 2006.05.31
申请号 EP20040780967 申请日期 2004.08.12
申请人 CREE, INC. 发明人 SLATER, DAVID, B, JR.;EDMOND, JOHN, A.;DONOFRIO, MATTHEW
分类号 H01L33/40;H01L21/027;H01L21/04;H01L21/263;H01L21/268;H01L33/00;H01L33/34 主分类号 H01L33/40
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