| 摘要 |
AN APPARATUS FOR TESTING ELECTRONIC DEVICES SUCH AS INTEGRATED CIRCUITS. IN ONE EMBODIMENT, AN APPARATUS FOR TESTING ELECTRONIC DEVICES IS DISCLOSED THAT INCLUDES A HOUSING SUCH AS A TEST CONTACTOR HOUSING (310) WHICH HAS A PLURALITY OF TEST CONTACTOR PINS THAT EXTEND THERETHROUGH. THE PLURALITY OF TEST CONTACTOR PINS INCLUDE A FIRST SET OF POWER PINS (350), A SECOND SET OF GROUND PINS (340), AND A THIRD SET OF SIGNAL PINS. A PRINTED CIRCUIT BOARD (320), ATTACHED TO THE HOUSING (310), HAS A FIRST GROUND PLANE (370) AND A FIRST POWER PLANE (360). THE POWER PINS (350) ARE ELECTRICALLY COUPLED TO THE FIRST POWER PLANE (360) AND THE GROUND PINS (340) ARE ELECTRICALLY COUPLED TO THE FIRST GROUND PLANE (370). THE FIRST SET OF POWER PINS (350), THE SECOND SET OF GROUND PINS (340), AND THE THIRD SET OF SIGNAL PINS EXTEND THROUGH THE PRINTED CIRCUIT BOARD (320).
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