Inspecting device for optical films

摘要

The invention is an inspecting device for optical films used to inspect the thickness homogeneousness and defects of optical films. It comprises one or more than one illuminant, one or more than one polarization device, a filtering device and a scattering device. The light radiates a beam passing through the filtering device to filter the most suitable beam for the inspection. The beam is polarized through the polarization device. The polarized beam is magnified through the scattering device. The inspecting device has a simple structure without the need of extra expensive instruments and extra processing procedures for the samples of optical films. The inspection procedure is simple and doesn't take a long time. Its cost is also not expensive. It is beneficial to reduce the production cost.