发明名称 Strained channel transistor and methods of manufacture
摘要 A semiconductor device includes a region of semiconductor material with first and second isolation trenches formed therein. The first isolation trench is lined with a first material having a low oxygen diffusion rate and is filled with an insulating material. The second isolation trench is not lined with the first material but is filled with an insulating material. A first transistor is formed adjacent the first isolation region and a second transistor formed adjacent the second isolation region.
申请公布号 US7052964(B2) 申请公布日期 2006.05.30
申请号 US20050081919 申请日期 2005.03.16
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YEO YEE-CHIA;KO CHIH-HSIN;LEE WEN-CHIN;HU CHENMING
分类号 H01L21/336;H01L21/762;H01L21/8238;H01L27/12 主分类号 H01L21/336
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