发明名称 Structure of flip chip semiconductor package for testing a bump and method of fabricating the same
摘要 A semiconductor package comprises a plurality of pads disposed along a surface edge of a semiconductor chip, a plurality of mounting bumps formed on a surface of the semiconductor chip and disposed away from the plurality of pads at a predetermined distance, a plurality of redistribution connecting wires for electrically connecting the plurality of pads to the plurality of mounting bumps, and a plurality of test bumps disposed on the plurality of pads.
申请公布号 KR100585142(B1) 申请公布日期 2006.05.30
申请号 KR20040031357 申请日期 2004.05.04
申请人 发明人
分类号 H01L21/60;H01L21/66;H01L23/02;H01L23/48;H01L23/58 主分类号 H01L21/60
代理机构 代理人
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