| 摘要 |
FIELD: electro-technical measurements, possible use for express observation of changes of surface density of charge and its middle position in flat dielectrics under various influences on is surface. ^ SUBSTANCE: charged dielectric-sample is positioned in gap of measuring vibration capacitor. Sample holder is mechanically rigidly connected to one of electrodes of auxiliary vibration capacitor. During excitation of mechanical oscillations of sample by frequency, significantly lesser than frequency of vibration capacitor, amplitude-modulated current appears in circuit of capacitor. Voltage, proportional to this current, is fed into input of vertical deviation of oscillograph ray. Movements of sample are transformed by auxiliary vibration capacitor to electric voltage, which is used as scanning voltage for oscillograph ray. On basis of alteration of inclination of signal contour lines on screen of oscillograph, charge changes are evaluated. On basis of movement of point of intersection of contour lines, alterations of its distribution center are evaluated. ^ EFFECT: increased efficiency. ^ 3 dwg |
