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发明名称
System and method for calculating yield and managing defect
摘要
申请公布号
KR100583529(B1)
申请公布日期
2006.05.26
申请号
KR20030068262
申请日期
2003.10.01
申请人
发明人
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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