PXI based tester for mixed signal semiconductor device,申请号KR20040085265-传众专利搜索

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发明名称	PXI based tester for mixed signal semiconductor device
摘要
申请公布号	KR100583620(B1)	申请公布日期	2006.05.26
申请号	KR20040085265	申请日期	2004.10.25
申请人		发明人
分类号	G01R31/28;G01R31/26	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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