发明名称 |
PROGRAMMABLE MEMORY BUILT-IN-SELF-TEST (MBIST) METHOD AND APPARATUS |
摘要 |
<p>Programmable memory built-in-self-test (MBIST) methods, apparatus, and systems are disclosed. Exemplary embodiments of the disclosed technology can be used, for example, to test one or more memories located on an integrated circuit during manufacturing testing.</p> |
申请公布号 |
WO2006055862(A2) |
申请公布日期 |
2006.05.26 |
申请号 |
WO2005US42029 |
申请日期 |
2005.11.18 |
申请人 |
MENTOR GRAPHICS CORPORATION;MUKHERJEE, NILANJAN;DU, XIAOGANG;CHENG, WU-TUNG |
发明人 |
MUKHERJEE, NILANJAN;DU, XIAOGANG;CHENG, WU-TUNG |
分类号 |
G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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