发明名称 |
COMPENSATION CIRCUIT WHICH COMPENSATES NON-UNIFORMITY ACCORDING TO CHANGE OF OPERATING TEMPERATURE OF BOLOMETER |
摘要 |
<p>The present invention relates to a bolometer, and more specifically to a compensation circuit for compensating non-uniformity due to the difference of operating temperature between bolometers which exist in bolometer array using semiconductor material. A compensation circuit according to the present invention comprises a biasing part including a first transistor generating bias current according to the change of operating temperature to have a dependency of exponential function for the operating temperature of circuit, and a second transistor turned on/off according to the column signal of a bolometer array; a bolometer part including a variable resistor for detecting IR in a pixel base, a third transistor turned on/off according to the column signal of a bolometer array coupled to one end of the variable resistor, and a fourth transistor turned on/off according to the row signal of a bolometer array coupled to the other end of the variable resistor; and an off-set compensation part for compensating the non-uniformity of the bolometer unit.</p> |
申请公布号 |
KR100586308(B1) |
申请公布日期 |
2006.05.26 |
申请号 |
KR20050031339 |
申请日期 |
2005.04.15 |
申请人 |
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
KANG, SANG GU;HWANG, CHI HO;LEE, YONG SOO;LEE, HEE CHUL |
分类号 |
G01J5/02;H01L31/09 |
主分类号 |
G01J5/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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