| 摘要 |
a test module having a correction section for correcting the supply timing of a test signal to a DUT or correcting the voltage level of the test signal for the DUT, a correction value holding section for holding a correction value used for correction by the correction section, and an identification information storage section for storing test module identification information which is identification information on the test module; a correction value database for storing a correction value to be held by the correction value holding section while correlating the value with the test module identification information; and control means for extracting a correction value from the correction value database while correlating it to the test module identification information stored in the identification information storage section and causing the correction value holding section to hold it.
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