发明名称 Bottom layer resist polymers for photolithography and methods of manufacturing the same
摘要 In one aspect, a bottom layer resist polymer has an expanded p-electron conjugation system based on a monomer unit having a 3,3'-diindenyl structure. The bottom layer resist polymer of this aspect is composed of a repeat unit having the 3,3'-diindenyl structure represented by the following formula: where l, m and n are respective mole fractions of monomer units of the polymer, where l+m+n=1, where l=0.1 to 0.9, m=0.1 to 0.9, and n=0 to 0.8, where each of k<SUB>1 </SUB>and k<SUB>2 </SUB>is independently 0 or 1, and each of R<SUB>1</SUB>, R<SUB>2</SUB>, R<SUB>3 </SUB>and R<SUB>4 </SUB>is independently a hydrogen atom or an unsaturated hydrocarbon, and where Z is a monomer unit including a bisphenol derivative.
申请公布号 US2006111547(A1) 申请公布日期 2006.05.25
申请号 US20050283841 申请日期 2005.11.22
申请人 HATA MITSUHIRO;WOO SANG-GYUN;KANG YOOL;RYOO MAN-HYOUNG;KIM HYUN-WOO;HAH JUNG-HWAN 发明人 HATA MITSUHIRO;WOO SANG-GYUN;KANG YOOL;RYOO MAN-HYOUNG;KIM HYUN-WOO;HAH JUNG-HWAN
分类号 C08G64/00 主分类号 C08G64/00
代理机构 代理人
主权项
地址