发明名称 Method for fabricating CMOS image sensor
摘要 Form a gate electrode on a transistor region of a first conductivity type semiconductor substrate including a photodiode region and the transistor region. Form lightly-doped second conductivity type diffusion areas at both sides of the gate electrode in the photodiode region and the transistor region. Form a screen layer over an entire surface of the semiconductor substrate including the gate electrode. Form a highly-doped second conductivity type diffusion area by planting second conductivity type impurity ions with high density to the entire surface of the semiconductor substrate using the photoresist pattern as a mask, and remove the photoresist pattern and the oxide layer.
申请公布号 US2006110873(A1) 申请公布日期 2006.05.25
申请号 US20050280318 申请日期 2005.11.17
申请人 DONGBU-ANAM SEMICONDUCTOR 发明人 HAN CHANG H.
分类号 H01L21/8238 主分类号 H01L21/8238
代理机构 代理人
主权项
地址