发明名称 MEASURING METHOD AND MEASURING DEVICE IN DISPLAY ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a simple means for measuring an absolute value of a residual DC accumulated on a display element and a time constant in the display element composed of a multilayer dielectric. SOLUTION: The absolute value of the residual DC accumulated on a display layer and the time constant thereof are measured by applying a periodical measuring voltage to the display element composed of the multilayer dielectric before and after residual DC accumulation respectively and measuring a phase change of a peak of a current caused by ions in the display layer brought about in response to the periodical measuring voltage. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006133379(A) 申请公布日期 2006.05.25
申请号 JP20040320565 申请日期 2004.11.04
申请人 CANON INC 发明人 HAMAGUCHI ATSUSHI
分类号 G02F1/167;G02F1/13 主分类号 G02F1/167
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