| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray examination apparatus capable of reducing the foreign noise generated in signals of an X-ray detector caused by the electrical effects of circuits or devices other than the X-ray detector. SOLUTION: This X-ray examination apparatus comprises an X-ray source for applying X rays to a subject, the X-ray detector 104 consisting of a plurality of X-ray detecting elements 110 for converting the X rays penetrating the subject 102 into electric signals, an X-ray collimator for collimating the X rays coming into the X-ray detector and removing scattered rays scattered by the subject, and a reading circuit for reading the electric signals from the X-ray detecting elements. The X-ray examination apparatus is characterized by the X-ray collimator, a part or the whole of which and the reading circuit are set at almost the same electric potential. COPYRIGHT: (C)2006,JPO&NCIPI
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