发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To solve the problem wherein there is the case where the characteristics of a transistor used for the input change with time in a conventional comparator using a differential input stage or the like and it is difficult for the comparator to maintain accurate operation. SOLUTION: A comparator circuit relating to an embodiment has: a comparator comparing voltages inputted to first and second input terminals and outputting a comparison result signal corresponding to a comparison result; an input switching circuit inputting a reference voltage and an input signal and outputting the reference voltage to one of the first and second input terminals while outputting the input signal to the other of the first and second input terminals according to a switching signal; an output inverting/noninverting circuit outputting the comparison result signal after inverting or not inverting the signal according to the switching signal; and a timer measuring the operation time of the comparator and outputting the switching signal according to the operation time. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006135655(A) 申请公布日期 2006.05.25
申请号 JP20040322330 申请日期 2004.11.05
申请人 NEC ELECTRONICS CORP 发明人 IKEDA ATSUSHI
分类号 H03K5/08;H03F3/34;H03M1/10 主分类号 H03K5/08
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