| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method for measuring an output characteristic precisely in a standard state of a group of multi-junction photoelectric conversion device by use of a dummy sunlight source at a low cost. <P>SOLUTION: In this measuring method, an output in the standard state of a test cell which is composed of a multi-junction photoelectric conversion device formed by stacking a plurality of element cells is measured as an output of a multi-junction photoelectric conversion device test cell measured under an arbitrary test light source. The method comprises the steps of obtaining the output in the standard state of a standard cell having a spectrum dependency equal to the test cell substantially, adjusting an illuminance of the test light source so as to obtain the output in the standard state of the standard cell, and measuring the output of the test cell under the test light source after adjustment of the illuminance. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p> |
