Devices, methods, and systems for measuring an optical property of a sample

摘要

Devices and methods are provided for measuring a property of a sample, such as an optical property. Embodiments of the subject invention include a device having sample measurement componentry and one or more enclosure-forming components, wherein one or more of the enclosure-forming components are movable, and wherein the device is configured so that one or more of the enclosure-forming components have a positional relationship that can change from an open position to a closed position in which one or more of the enclosure-forming components define an enclosed space accessible by the sample measurement componentry. Also provided are systems and kits.