发明名称 SAMPLE SUPPLY METHOD AND SAMPLE SUPPLY DEVICE
摘要 PROBLEM TO BE SOLVED: To enhance maintainability during measurements, regarding a sample supply method and a sample supply device for supplying a sample to a sample supply flow passage that a measuring unit of a measuring apparatus such as a surface plasmon sensor has. SOLUTION: The sample supply device is used comprising a body formed with an inlet pipette chip mounting part and an outlet pipette chip mounting part; an inlet piston in communication with the inlet pipette tip mounting part for sucking and discharging air from the inlet pipette tip mounting part; an operating part for operating the inlet piston; an inlet pipette chip 90 for mounting on the inlet pipette chip mounting part; and an outlet pipette chip 91 for mounting on the outlet pipette chip mounting part. The inlet pipette chip 90 and the outlet pipette chip 91 are inserted respectively into the inlet 61 and the outlet 65 of the flow passage 60 of the measuring unit and the sample is fed from the inlet pipette chip 90 toward the outlet pipette chip 91. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006133220(A) 申请公布日期 2006.05.25
申请号 JP20050285927 申请日期 2005.09.30
申请人 FUJI PHOTO FILM CO LTD 发明人 SHIMIZU HITOSHI
分类号 G01N1/00;G01N21/27;G01N33/543 主分类号 G01N1/00
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