发明名称 |
Extraction of imperfection features through spectral analysis |
摘要 |
Autonomous non-destructive inspection equipment provides automatic and/or continuous inspection and evaluation of a material under inspection. The inspection equipment preferably comprises at least one detection sensor and at least one detection sensor interface for a computer. The autonomous non-destructive inspection capability may also be retrofitted into conventional inspection systems by extracting pertinent features through spectral frequency analysis and sensor compensation and utilizing those features in the autonomous non-destructive inspection system.
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申请公布号 |
US2006111872(A1) |
申请公布日期 |
2006.05.25 |
申请号 |
US20050079745 |
申请日期 |
2005.03.14 |
申请人 |
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发明人 |
PAPADIMITRIOU WANDA G.;PAPADIMITRIOU STYLIANOS |
分类号 |
G06F11/30 |
主分类号 |
G06F11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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