发明名称 Extraction of imperfection features through spectral analysis
摘要 Autonomous non-destructive inspection equipment provides automatic and/or continuous inspection and evaluation of a material under inspection. The inspection equipment preferably comprises at least one detection sensor and at least one detection sensor interface for a computer. The autonomous non-destructive inspection capability may also be retrofitted into conventional inspection systems by extracting pertinent features through spectral frequency analysis and sensor compensation and utilizing those features in the autonomous non-destructive inspection system.
申请公布号 US2006111872(A1) 申请公布日期 2006.05.25
申请号 US20050079745 申请日期 2005.03.14
申请人 发明人 PAPADIMITRIOU WANDA G.;PAPADIMITRIOU STYLIANOS
分类号 G06F11/30 主分类号 G06F11/30
代理机构 代理人
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