发明名称 |
INSPECTION DEVICE AND INSPECTION METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To enhance alignment precision in order to enhance a comparing inspection capacity. <P>SOLUTION: When the misregistration amount of the representative noticeable pixel in a representative pixel region is calculated, the misregistration amount of each peripheral noticeable pixel in the peripheral pixel region group allowed to get out to the periphery of the representative pixel region being a statistic processing region (voting target region) is subjected to statistic processing (voting processing) to determine misregistration amount of high frequency. The correct solution of alignment is enhanced by utilizing the misregistration amount of high frequency. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006132947(A) |
申请公布日期 |
2006.05.25 |
申请号 |
JP20040318776 |
申请日期 |
2004.11.02 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
HAMAMATSU REI;MAEDA SHUNJI;OSHIMA YOSHIMASA;SHIBUYA HISAE;NAKANO HIROYUKI |
分类号 |
G01N21/956;G01B11/30;G06T1/00;H01L21/66 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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