发明名称 METHOD OF FORMING RUTHENIUM FILM AND TUNNEL MAGNETORESISTANCE EFFECT MULTILAYER FILM
摘要 PROBLEM TO BE SOLVED: To provide a method of forming an Ru film which can perform precise film thickness control and a tunnel magnetoresistance effect multilayer film. SOLUTION: The method of forming the Ru film includes a step of giving a predetermined bias potential to a substrate 20 when a non-magnetic Ru film interposed between a pair of ferromagnetic films is formed by a sputtering method, in the case that the tunnel magnetoresistance effect layer is formed on the substrate 20. In this case, in the case of sputtering, a predetermined high frequency power is applied to the substrate 20, and it can be controlled so that the potential of the substrate 20 is set to -20 to -100 V. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006134913(A) 申请公布日期 2006.05.25
申请号 JP20040318914 申请日期 2004.11.02
申请人 ULVAC JAPAN LTD 发明人 MORITA TADASHI
分类号 H01L43/08;G11B5/39;H01F10/32;H01F41/18;H01L21/8246;H01L27/105 主分类号 H01L43/08
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